Wednesday, October 24, 2012

Microcantilever Q control via capacitive coupling

(author unknown)



Magdalena Huefner, Adam Pivonka, and Jeehoon Kim et al.

We introduce a versatile method to control the quality factor Q of a conducting cantilever in an atomic force microscope (AFM) via capacitive coupling to the local environment. Using this method, Q may be reversibly tuned to within ∼ 10% of any desired value over several orders of magnitude. A po ... [Appl. Phys. Lett. 101, 173110 (2012)] published Wed Oct 24, 2012.



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