Wednesday, February 06, 2013

Nanoparticles charge response from electrostatic force microscopy

(author unknown)



A. Mottaghizadeh, P. L. Lang, and L. M. Cui et al.

Electrostatic force microscopy (EFM) allows measurement of tiny changes in tip-sample capacitance. When nanoobjects are studied by EFM, they only contribute a very small fraction of the total capacitance between the tip and the sample. We show that the analysis of 3D maps of the EFM signal allows ... [Appl. Phys. Lett. 102, 053118 (2013)] published Wed Feb 06, 2013.



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