Wednesday, February 13, 2013

Nanoscale imaging of photoelectrons using an atomic force microscope

(author unknown)



Ping Yu and Jürgen Kirschner

Photoemission current imaging at the nanoscale is demonstrated by combining an atomic force microscope with laser excitation. Photoelectrons emitted from the sample are collected by the tip while the tip-sample distance is precisely controlled by their van der Waals force interaction. We observe p ... [Appl. Phys. Lett. 102, 063111 (2013)] published Wed Feb 13, 2013.



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