Tuesday, February 19, 2013

Probing the electrical transport properties of intrinsic InN nanowires

(author unknown)



S. Zhao, O. Salehzadeh, and S. Alagha et al.

We have studied the electrical transport properties of intrinsic InN nanowires using an electrical nanoprobing technique in a scanning electron microscope environment. It is found that such intrinsic InN nanowires exhibit an ohmic conduction at low bias and a space charge limited conduction at hig ... [Appl. Phys. Lett. 102, 073102 (2013)] published Tue Feb 19, 2013.



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