Tuesday, February 19, 2013

Trapping and Recombination Properties of the Acceptor-like VZn-H Complex Defect in ZnO

K. Senthilkumar, M. Subramanian, H. Ebisu, M. Tanemura and Y. Fujita



TOC Graphic


The Journal of Physical Chemistry C

DOI: 10.1021/jp312209c






Link to full article
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