Ultra-thin filaments revealed by the dielectric response across the metal-insulator transition in VO2

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J.-G. Ramírez, Rainer Schmidt, and A. Sharoni et al.

Temperature dependent dielectric spectroscopy measurements on vanadium dioxide thin films allow us to distinguish between the resistive, capacitive, and inductive contributions to the impedance across the metal-insulator transition (MIT). We developed a single, universal, equivalent circuit model ... [Appl. Phys. Lett. 102, 063110 (2013)] published Wed Feb 13, 2013.



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