Thursday, April 18, 2013

Noninvasive Spatial Metrology of Single-Atom Devices

Fahd A. Mohiyaddin, Rajib Rahman, Rachpon Kalra, Gerhard Klimeck, Lloyd C. L. Hollenberg, Jarryd J. Pla, Andrew S. Dzurak and Andrea Morello



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Nano Letters

DOI: 10.1021/nl303863s






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