Juhwan Kim, Kang-Jun Baeg, Dongyoon Khim, David T. James, Ji-Seon Kim, Bogyu Lim, Jin-Mun Yun, Hyung-Gu Jeong, Paul S. K. Amegadze, Yong-Young Noh and Dong-Yu Kim
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Chemistry of Materials
DOI: 10.1021/cm303908f
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