Wednesday, April 17, 2013

Self-sensing atomic force microscopy cantilevers based on tunnel magnetoresistance sensors

(author unknown)



Ali Tavassolizadeh, Tobias Meier, and Karsten Rott et al.

Here, we introduce self-sensing cantilevers for atomic force microscopy (AFM) based on tunnel magnetoresistance (TMR) sensors. These TMR sensors are integrated into the AFM cantilevers and consist of a magnetically stable layer and a sensing magnetostrictive CoFeB layer separated by a MgO tunnelin ... [Appl. Phys. Lett. 102, 153104 (2013)] published Wed Apr 17, 2013.



Link to full article

No comments:

Post a Comment