Wednesday, July 09, 2014

Towards a unified description of the charge transport mechanisms in conductive atomic force microscopy studies of semiconducting polymers

Nanoscale , 2014, Accepted Manuscript

DOI: 10.1039/C4NR02577F, Paper

David Moerman, Noham Sebaihi, Sreejith Embekkat Kaviyil, phil leclere, Roberto Lazzaroni, Olivier Douheret

In this work, conductive atomic force microscopy (C-AFM) is used to study the local electrical properties in thin films of self-organized fibrillate poly(3-hexylthiophene) (P3HT), as a reference polymer semiconductor. Depending...

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