Nanoscale , 2014, Advance Article
DOI: 10.1039/C4NR02215G, Paper
DOI: 10.1039/C4NR02215G, Paper
Zhenghua Li, Xiang Li, Dongping Liu, H. Saito, S. Ishio
Near field magnetic force microscopy (NF-MFM) has been demonstrated to locally observe the magnetic fine structures in nanosized recording bits at an operating distance of 1 nm.
To cite this article before page numbers are assigned, use the DOI form of citation above.
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Near field magnetic force microscopy (NF-MFM) has been demonstrated to locally observe the magnetic fine structures in nanosized recording bits at an operating distance of 1 nm.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
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