Thursday, October 09, 2014

High-resolution characterization of the diffusion of light chemical elements in metallic components by Scanning Atomic Force Microscopy

Nanoscale , 2014, Accepted Manuscript

DOI: 10.1039/C4NR04017A, Paper

Virgil Optasanu, Eric Bourillot, Pauline Vitry, Cedric Plassard, Laure Beaurenaut, Pierre Jacquinot, Frederic herbst, Pascal Berger, Eric Lesniewska, tony montesin

An original sub-surface, high spatial resolution tomographic technique based on Scanning Microwave Microscopy (SMM) is used to visualize in-depth materials with different chemical composition. A significant phase difference in SMM...

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