Thursday, October 30, 2014

In Situ Transmission Electron Microscopy Probing of Native Oxide and Artificial Layers on Silicon Nanoparticles for Lithium Ion Batteries

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ACS Nano

DOI: 10.1021/nn505523c




Yang He, Daniela Molina Piper, Meng Gu, Jonathan J. Travis, Steven M. George, Se-Hee Lee, Arda Genc, Lee Pullan, Jun Liu, Scott X. Mao, Ji-Guang Zhang, Chunmei Ban and Chongmin Wang

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