Nanoscale , 2015, Advance Article
DOI: 10.1039/C4NR05907G, Paper
DOI: 10.1039/C4NR05907G, Paper
Christian Dietz, Marcus Schulze, Agnieszka Voss, Christian Riesch, Robert W. Stark
Bimodal frequency-modulated atomic force microscopy using small cantilevers enables the gentle imaging of heterogeneous materials with a high lateral resolution and data quantification, e.g. tip-sample force and sample elasticity.
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Bimodal frequency-modulated atomic force microscopy using small cantilevers enables the gentle imaging of heterogeneous materials with a high lateral resolution and data quantification, e.g. tip-sample force and sample elasticity.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
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