Nanoscale , 2015, 7,1849-1856
DOI: 10.1039/C4NR05907G, Paper
DOI: 10.1039/C4NR05907G, Paper
Christian Dietz, Marcus Schulze, Agnieszka Voss, Christian Riesch, Robert W. Stark
Bimodal frequency-modulated atomic force microscopy using small cantilevers enables the gentle imaging of heterogeneous materials with a high lateral resolution and data quantification, e.g. tip-sample force and sample elasticity.
The content of this RSS Feed (c) The Royal Society of Chemistry
Bimodal frequency-modulated atomic force microscopy using small cantilevers enables the gentle imaging of heterogeneous materials with a high lateral resolution and data quantification, e.g. tip-sample force and sample elasticity.
The content of this RSS Feed (c) The Royal Society of Chemistry
Click for full article
No comments:
Post a Comment