Thursday, February 05, 2015

Enhanced Electrical Transparency by Ultrathin LaAlO3 Insertion at Oxide Metal/Semiconductor Heterointerfaces

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Nano Letters

DOI: 10.1021/nl504169m




Takeaki Yajima, Makoto Minohara, Christopher Bell, Hiroshi Kumigashira, Masaharu Oshima, Harold Y. Hwang and Yasuyuki Hikita

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