Friday, February 20, 2015

High-Throughput and Label-Free Single Nanoparticle Sizing Based on Time-Resolved On-Chip Microscopy

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ACS Nano

DOI: 10.1021/acsnano.5b00388




Euan McLeod, T. Umut Dincer, Muhammed Veli, Yavuz N. Ertas, Chau Nguyen, Wei Luo, Alon Greenbaum, Alborz Feizi and Aydogan Ozcan

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