Nanoscale , 2015, Advance Article
DOI: 10.1039/C4NR07619B, Paper
DOI: 10.1039/C4NR07619B, Paper
Shengnan Lu, Junjie Qi, Yousong Gu, Shuo Liu, Qiankun Xu, Zengze Wang, Qijie Liang, Yue Zhang
The influence of carrier concentration on piezotronics was assessed with a ZnO/Au Schottky barrier by SKPM and I-V measurements. The results show a gradual disappeared piezotronic effect with increasing carrier concentration, which was attributed to the strengthened screening effect.
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The influence of carrier concentration on piezotronics was assessed with a ZnO/Au Schottky barrier by SKPM and I-V measurements. The results show a gradual disappeared piezotronic effect with increasing carrier concentration, which was attributed to the strengthened screening effect.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
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