Nanoscale , 2015, Advance Article
DOI: 10.1039/C4NR05940A, Paper
DOI: 10.1039/C4NR05940A, Paper
Musashi Takenaka, Yusuke Miyachi, Jun Ishii, Chiaki Ogino, Akihiko Kondo
An atomic force microscope (AFM) can measure the adhesion force between a sample and a cantilever while simultaneously applying a rupture force during the imaging of a sample.
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An atomic force microscope (AFM) can measure the adhesion force between a sample and a cantilever while simultaneously applying a rupture force during the imaging of a sample.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
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