Monday, February 16, 2015

X-ray Absorption Spectroscopy Study of TiO2–x Thin Films for Memory Applications

TOC Graphic


The Journal of Physical Chemistry C

DOI: 10.1021/jp511739h




D. Carta, G. Mountjoy, A. Regoutz, A. Khiat, A. Serb and T. Prodromakis

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