Tuesday, March 17, 2015

Depth Profiling Charge Accumulation from a Ferroelectric into a Doped Mott Insulator

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Nano Letters

DOI: 10.1021/acs.nanolett.5b00104




Maya Marinova, Julien E. Rault, Alexandre Gloter, Slavomir Nemsak, Gunnar K. Palsson, Jean-Pascal Rueff, Charles S. Fadley, Cécile Carrétéro, Hiroyuki Yamada, Katia March, Vincent Garcia, Stéphane Fusil, Agnès Barthélémy, Odile Stéphan, Christian Colliex and Manuel Bibes

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