Tuesday, March 03, 2015

Detection and characterization of nanoparticles in suspension at low concentrations using the X-ray total scattering pair distribution function technique




Nanoscale , 2015, Advance Article

DOI: 10.1039/C4NR06486K, Paper

Maxwell W. Terban, Matthew Johnson, Marco Di Michiel, Simon J. L. Billinge

Total scattering experiments are used with pair distribution function analysis to study nanoscale structure and morphology in highly disordered samples. We investigate sensitivity for the case of organic nanoparticles in dilute solution.

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