Nanoscale , 2015, 7,5617-5623
DOI: 10.1039/C4NR06707J, Communication
DOI: 10.1039/C4NR06707J, Communication
Kyunghee Choi, Syed Raza Ali Raza, Hee Sung Lee, Pyo Jin Jeon, Atiye Pezeshki, Sung-Wook Min, Jin Sung Kim, Woojin Yoon, Sang-Yong Ju, Kimoon Lee, Seongil Im
Channel and interface traps in top-gate MoS2 FETs were analyzed by photo-electric probing.
The content of this RSS Feed (c) The Royal Society of Chemistry
Channel and interface traps in top-gate MoS2 FETs were analyzed by photo-electric probing.
The content of this RSS Feed (c) The Royal Society of Chemistry
Click for full article
No comments:
Post a Comment