Wednesday, April 01, 2015

Layer number identification of intrinsic and defective multilayer graphenes by the Raman mode intensity from substrate

Nanoscale , 2015, Accepted Manuscript

DOI: 10.1039/C5NR01514F, Paper

Xiaoli Li, Xiaofen Qiao, Wen-Peng Han, Yan Lu, Qing-Hai Tan, Xue-Lu Liu, Pingheng Tan

SiO2/Si substrate has been widely used to support two-dimensional (2-D) flakes grown by chemical vapor deposition or prepared by micromechanical cleavage. Raman intensity of the vibration modes of 2-D flakes...

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