Nanoscale , 2015, Advance Article
DOI: 10.1039/C5NR01514F, Paper
DOI: 10.1039/C5NR01514F, Paper
Xiao-Li Li, Xiao-Fen Qiao, Wen-Peng Han, Yan Lu, Qing-Hai Tan, Xue-Lu Liu, Ping-Heng Tan
Raman signals from Si substrates have been used as a robust, fast and nondestructive way to probe the layer number of graphene flakes up to 100 layers.
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Raman signals from Si substrates have been used as a robust, fast and nondestructive way to probe the layer number of graphene flakes up to 100 layers.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
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