Thursday, May 07, 2015

Increased Localization Precision by Interference Fringe Analysis

Nanoscale, 2015, Accepted Manuscript
DOI: 10.1039/C5NR01927C, Paper
Carl Ebeling, Amihai Meiri, Jason Martineau, Zeev Zalevsky, Jordan Gerton, Rajesh Menon
We report a novel optical single-emitter-localization methodology that uses the phase induced by path length differences in a Mach-Zehnder interferometer to improve localization precision. Using information theory, we demonstrate that...
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