Nanoscale, 2015, Advance Article
DOI: 10.1039/C5NR01874A, Communication
DOI: 10.1039/C5NR01874A, Communication
Martin Hjort, Johan V. Knutsson, Bernhard Mandl, Knut Deppert, Edvin Lundgren, Rainer Timm, Anders Mikkelsen
Scanning tunnelling microscopy is used to probe the surface morphology of well-defined, Au-free grown InAs nanowires. The surface geometry is characterized over all relevant length scales ranging from microns down to single atoms.
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Scanning tunnelling microscopy is used to probe the surface morphology of well-defined, Au-free grown InAs nanowires. The surface geometry is characterized over all relevant length scales ranging from microns down to single atoms.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
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