Thursday, July 30, 2015

Combining 2 nm Spatial Resolution and 0.02% Precision for Deformation Mapping of Semiconductor Specimens in a Transmission Electron Microscope by Precession Electron Diffraction

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Nano Letters
DOI: 10.1021/acs.nanolett.5b01614

David Cooper, Nicolas Bernier and Jean-Luc Rouvière
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