Nanoscale, 2015, Accepted Manuscript
DOI: 10.1039/C5NR02096D, Paper
DOI: 10.1039/C5NR02096D, Paper
Daniele Passeri, Emanuela Tamburri, Maria Letizia Terranova, Marco Rossi
Based on atomic force microscopy (AFM), torsional harmonics atomic force microscopy (TH-AFM, also referred to with the commercial name HarmoniXTM) allows one to perform quantitative characterization of the mechanical properties...
The content of this RSS Feed (c) The Royal Society of Chemistry
Based on atomic force microscopy (AFM), torsional harmonics atomic force microscopy (TH-AFM, also referred to with the commercial name HarmoniXTM) allows one to perform quantitative characterization of the mechanical properties...
The content of this RSS Feed (c) The Royal Society of Chemistry
Click for full article
No comments:
Post a Comment