Nanoscale, 2015, Advance Article
DOI: 10.1039/C5NR03671B, Paper
DOI: 10.1039/C5NR03671B, Paper
James W. Borchert, Ian E. Stewart, Shengrong Ye, Aaron R. Rathmell, Benjamin J. Wiley, Karen I. Winey
A combination of Rutherford Backscattering Spectrometry and Monte Carlo simulations were used to characterize the effect of post-treatment methods, area coverage and length distribution on the performance of copper nanowire-based transparent conductors.
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A combination of Rutherford Backscattering Spectrometry and Monte Carlo simulations were used to characterize the effect of post-treatment methods, area coverage and length distribution on the performance of copper nanowire-based transparent conductors.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
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