Nanoscale, 2015, Accepted Manuscript
DOI: 10.1039/C5NR04982B, Communication
DOI: 10.1039/C5NR04982B, Communication
Mark Buckwell, Luca Montesi, Stephen Hudziak, Adnan Mehonic, Anthony Kenyon
We present results from an imaging study of filamentary conduction in silicon suboxide resistive RAM devices. We used a conductive atomic force microscope to etch through devices while measuring current,...
The content of this RSS Feed (c) The Royal Society of Chemistry
We present results from an imaging study of filamentary conduction in silicon suboxide resistive RAM devices. We used a conductive atomic force microscope to etch through devices while measuring current,...
The content of this RSS Feed (c) The Royal Society of Chemistry
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