Nanoscale, 2015, 7,16625-16630
DOI: 10.1039/C5NR05512A, Communication
DOI: 10.1039/C5NR05512A, Communication
Faruk Dirisaglik, Gokhan Bakan, Zoila Jurado, Sadid Muneer, Mustafa Akbulut, Jonathan Rarey, Lindsay Sullivan, Maren Wennberg, Adrienne King, Lingyi Zhang, Rebecca Nowak, Chung Lam, Helena Silva, Ali Gokirmak
A high-speed, device-level characterization technique is developed to capture metastable electrical properties, crystallization and resistance drift behaviour.
The content of this RSS Feed (c) The Royal Society of Chemistry
A high-speed, device-level characterization technique is developed to capture metastable electrical properties, crystallization and resistance drift behaviour.
The content of this RSS Feed (c) The Royal Society of Chemistry
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