The use of a Ga + focused ion beam to modify graphene for device applications

B S Archanjo, A P M Barboza, B R A Neves, L M Malard, E H M Ferreira, J C Brant, E S Alves, F Plentz, V Carozo, B Fragneaud, I O Maciel, C M Almeida, A Jorio and C A Achete Link to full article

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