Quantitative Nanoscale Imaging of Lattice Distortions in Epitaxial Semiconductor Heterostructures Using Nanofocused X-ray Bragg Projection Ptychography

S. O. Hruszkewycz, M. V. Holt, C. E. Murray, J. Bruley, J. Holt, A. Tripathi, O. G. Shpyrko, I. McNulty, M. J. Highland and P. H. Fuoss

Nano Letters

DOI: 10.1021/nl303201w

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