Wednesday, October 10, 2012

Electrical Property Heterogeneity at Transparent Conductive Oxide/Organic Semiconductor Interfaces: Mapping Contact Ohmicity Using Conducting-Tip Atomic Force Microscopy

Gordon A. MacDonald, P. Alexander Veneman, Diogenes Placencia and Neal R. Armstrong



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ACS Nano

DOI: 10.1021/nn303043y






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