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Jón Mattis Hoffmann, Benedikt Hauer, and Thomas Taubner
Scattering-type scanning near-field optical microscopy (s-SNOM) allows for optical nanoscale imaging and provides information about topographical and chemical material properties with subwavelength resolution. In this letter, we demonstrate that the sensitivity of s-SNOM can be improved by means o ... [Appl. Phys. Lett. 101, 193105 (2012)] published Fri Nov 09, 2012.
Link to full article
Jón Mattis Hoffmann, Benedikt Hauer, and Thomas Taubner
Scattering-type scanning near-field optical microscopy (s-SNOM) allows for optical nanoscale imaging and provides information about topographical and chemical material properties with subwavelength resolution. In this letter, we demonstrate that the sensitivity of s-SNOM can be improved by means o ... [Appl. Phys. Lett. 101, 193105 (2012)] published Fri Nov 09, 2012.
Link to full article
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