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Wednesday, December 19, 2012

Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy

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Ayako Hashimoto, Peng Wang, and Masayuki Shimojo et al.

We observed Pt nanoparticles on carbon nanohorn aggregates by annular dark-field scanning confocal electron microscopy (ADF-SCEM) with an aberration-corrected microscope for three-dimensional (3D) imaging. The object elongation length along an optical axis that corresponds to the depth resolution ... [Appl. Phys. Lett. 101, 253108 (2012)] published Wed Dec 19, 2012.



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