Quantitatively Enhanced Reliability and Uniformity of High-κ Dielectrics on Graphene Enabled by Self-Assembled Seeding Layers

Vinod K. Sangwan, Deep Jariwala, Stephen A. Filippone, Hunter J. Karmel, James E. Johns, Justice M. P. Alaboson, Tobin J. Marks, Lincoln J. Lauhon and Mark C. Hersam

Nano Letters

DOI: 10.1021/nl3045553

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