Stephan F. Heucke, Fabian Baumann, Guillermo P. Acuna, Philip M. D. Severin, Stefan W. Stahl, Mathias Strackharn, Ingo H. Stein, Philipp Altpeter, Philip Tinnefeld and Hermann E. Gaub

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Nano Letters
DOI: 10.1021/nl401517a
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