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Monday, July 08, 2013
Effect of Doping Density on the Charge Rearrangement and Interface Dipole at the Molecule–Silicon Interface
The Journal of Physical Chemistry C
DOI: 10.1021/jp403177e
Omer Yaffe, Sidharam Pujari, Ofer Sinai, Ayelet Vilan, Han Zuilhof, Antoine Kahn, Leeor Kronik, Hagai Cohen and David Cahen
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