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Thursday, August 01, 2013
Direct Imaging of Charged Impurity Density in Common Graphene Substrates
Nano Letters
DOI: 10.1021/nl4012529
Kristen M. Burson, William G. Cullen, Shaffique Adam, Cory R. Dean, K. Watanabe, T. Taniguchi, Philip Kim and Michael S. Fuhrer
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