Near field imaging of a semiconductor laser by scanning probe microscopy without a photodetector

M. S. Dunaevskiy, P. A. Alekseev, and A. N. Baranov et al.

We propose an experimental method of near field optical imaging by scanning probe microscopy in which the probe itself serves as an infrared photodetector. The method providing a submicron spatial resolution is based on detection of a shift of the probe resonance related to its heating by absorbed ... [Appl. Phys. Lett. 103, 053120 (2013)] published Fri Aug 02, 2013.



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