We have measured the low-frequency noises of ultrathin indium tin oxide films to investigate the effect of post annealing on the noise level. The noises obtained obey an approximate 1/f law in the frequency range f ≈ 0.1–20 Hz. The microstructures and grain sizes of our films were altered by adjus ... [Appl. Phys. Lett. 103, 123118 (2013)] published Fri Sep 20, 2013.
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