Temperature-Dependent Reduction of Epitaxial Ce1–xPrxO2−δ (x = 0–1) Thin Films on Si(111): A Combined Temperature-Programmed Desorption, X-ray Diffraction, X-ray Photoelectron Spectroscopy, and Raman Study

The Journal of Physical Chemistry C

DOI: 10.1021/jp4082867

Marvin Hartwig Zoellner, Gang Niu, Jin-Hao Jhang, Andreas Schaefer, Peter Zaumseil, Marcus Bäumer and Thomas Schroeder

Click for full article