Capturing Wetting States in Nanopatterned Silicon

ACS Nano

DOI: 10.1021/nn405621w

XiuMei Xu, Guy Vereecke, Chang Chen, Geoffrey Pourtois, Silvia Armini, Niels Verellen, Wei-Kang Tsai, Dong-Wook Kim, Eunsongyi Lee, Chang-You Lin, Pol Van Dorpe, Herbert Struyf, Frank Holsteyns, Victor Moshchalkov, Joseph Indekeu and Stefan De Gendt

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