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Thursday, January 09, 2014

Nanoscopic polypyrrole AFM-SECM probes enabling force measurements under potential control




Nanoscale , 2014, Advance Article

DOI: 10.1039/C3NR05086F, Paper

P. Knittel, M. J. Higgins, C. Kranz

Nanoscopic conductive polymer atomic force-scanning electrochemical microscopy (AFM-SECM) probes for the investigation of specific interactions between samples (e.g. living cells) and the electrochemically switchable polymer probe.

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