Influence of Environment on the Measurement of Rates of Charge Transport across AgTS/SAM//Ga2O3/EGaIn Junctions

Chemistry of Materials

DOI: 10.1021/cm5014784

Jabulani R. Barber, Hyo Jae Yoon, Carleen M. Bowers, Martin M. Thuo, Benjamin Breiten, Diana M. Gooding and George M. Whitesides

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