In-Depth Investigation of the Carbon Microstructure of Silicon Carbide-Derived Carbons by Wide-Angle X-ray Scattering

The Journal of Physical Chemistry C

DOI: 10.1021/jp502832x

Kristin Faber, Felix Badaczewski, Martin Oschatz, Giovanni Mondin, Winfried Nickel, Stefan Kaskel and Bernd M. Smarsly

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