Gate-Induced Carrier Delocalization in Quantum Dot Field Effect Transistors

Nano Letters

DOI: 10.1021/nl5029655

Michael E. Turk, Ji-Hyuk Choi, Soong Ju Oh, Aaron T. Fafarman, Benjamin T. Diroll, Christopher B. Murray, Cherie R. Kagan and James M. Kikkawa

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