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Monday, September 15, 2014

Intensity-Modulated Scanning Kelvin Probe Microscopy for Probing Recombination in Organic Photovoltaics

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ACS Nano

DOI: 10.1021/nn5045867




Guozheng Shao, Micah S. Glaz, Fei Ma, Huanxin Ju and David S. Ginger

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